Atomic-level characterization of grain-boundary segregation and elemental site-location in Ni-base superalloy by aberration-corrected scanning transmission electron microscopy

Chemical analysis at atomic-level spatial resolution with single-atom detection sensitivity is one of the ultimate goals in materials characterization. Such atomic-level materials characterization would be possible by Electron Energy-Loss Spectrometry (EELS) and X-Ray Energy Dispersive Spectrometry (XEDS) in aberration-corrected Scanning Transmission Electron Microscopes (STEMs) because more probe current can be added into the incident probe by aberration correction... (AU) © 2010 by The Materials, Metals, & Materials Society. All rights reserved.